PCB Manufacturing Solutions – GEM Compact

MVPs GEM Compact AOI system is a revolutionary tabletop, lightweight inspection solution. MVP is now offering unsurpassed high performance and high resolution capabilities previously only available with in-line AOI platforms. The GEM Compact represents a breakthrough in tabletop inspection by providing the leading comprehensive solutions to complex inspection challenges.

Fast Programming Generation using new ease-of-use software
High Throughput to 5 Sq Inches per Second.
Highest Defect Detection using Tri-Color Technology.
12” x 16” Board Size
Lowest False Call Rates
2D Paste Capable
GEM
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